The article “An electrostatic ion pump with nanostructured Si field emission electron source and Ti particle collectors for supporting an ultra-high vacuum in miniaturized atom interferometry systems” was selected by the referees and the Editorial Board of the Journal of Micromechanics and Microengineering (JMM) for the JMM 2016 Highlights Collection – a selection of the top 25 highest-quality papers published during the year; JMM is one of the leading journals on microelectromechanical and nanoelectromechanical systems.
The direct links to the JMM Highlight collection and the article are
http://iopscience.iop.org/journal/0960-1317/page/Highlights-of-2016
http://iopscience.iop.org/article/10.1088/0960-1317/26/12/124003
Congratulations Anirban!