Year: 2012

  • Eric selected to present at MEMS 2012

    Congratulations to Eric Heubel, who has been selected to present a poster at the IEEE MEMS 2012 conference in Taipei, Taiwan on his work, “Batch-Fabricated MEMS Retarding Potential Analyzer for High-Accuracy Ion Energy Measurements.” The conference takes place from January 20th-24th 2012.